To provide training for students, staff and visiting researchers on scanning electron microscopes (SEMs), electron microprobe, x-ray microanalysis through both X-ray energy dispersive spectrometry (XEDS) and Wavelength dispersive spectrometry (WDS), electron backscattering diffraction (EBSD) analysis and sample preparation instruments. Support research efforts through advice on applications of electron microscopy, x-ray microanalysis and EBSD techniques. Help expand the user base of these instruments among Lehigh as well as external users in academia and industry. Administer maintenance, evaluation and calibration procedures for scanning electron microscope, electron microprobe, EBSD and x-ray microanalysis instruments.