General DescriptionThe Materials Characterization and Processing (MCP) facility of Johns Hopkins University is looking to hire an experienced Research Scientist to run the brand new Focused Ion Beam lab. The successful applicant will be responsible for operation, training, technical support, and maintenance of the Helios FIB and SEM within the MCP. Secondary responsibility would be to support the TEM Manager with equipment maintenance and training of users of the Tecnai TF30. Specific required FIB experiences are: 1) TEM sample preparation, 2) 3D EDX and EBSD data acquisition and processing, and 3) cryo-FIB applications. Specific SEM experiences are: 1) low voltage and low vacuum imaging, and 2) quantitative EDX analysis.JHU engages in a wide variety of research activiti